Editors at Test & Measurement World named the NI CompactDAQ USB-based modular data acquisition system from National Instruments a Best in Test winner and a finalist for the Test Product of the Year in the publication's 2007 Best in Test Awards.
Rick Nelson, Chief Editor of Test & Measurement World, said: "Our readers can benefit from rugged, portable and modular data acquisition systems that are flexible and easy to use. NI CompactDAQ fits the bill in that it combines plug-and-play USB capability with high-speed analogue and digital I/O for factory, lab and field applications."
The NI CompactDAQ system offers an eight-slot chassis that accepts I/O modules capable of measuring up to 256 channels of electrical, physical, mechanical and acoustic signals in a single system. NI CompactDAQ delivers connectivity and signal conditioning for measurements including voltage, temperature, strain, sound and vibration, as well as digital I/O and switching. All modules are hot-swappable and autodetectable for simplified setup, and offer up to 2300Vrms of isolation to ensure PC and user safety. The system is excellent for sensor and electrical measurements on the benchtop, in the field and on the production line.
Through signal streaming technology developed by National Instruments, NI CompactDAQ delivers four dedicated USB signal streams for synchronous analogue and digital I/O. This high-bandwidth technology is necessary for data-intensive applications including sound and vibration, mixed-signal automated test and high-speed data logging. In addition, the small size (25 x 9 x 9cm) and flexible power options (AC or 11 to 30V DC) make NI CompactDAQ suitable for a wide range of test settings, such as in-vehicle, benchtop and automated test applications.
Tim Dehne, NI Senior Vice President of R&D, commented: "We are very pleased that T&M World has recognised the significance of the NI CompactDAQ system with its Best in Test award. NI invests heavily in R&D, resulting in high-quality, high-performance products that revolutionise the way engineers and scientists work. The NI CompactDAQ modular data acquisition system takes full advantage of the bandwidth of Hi-Speed USB and minimises both size and power consumption for portable requirements. It provides fast and accurate measurements in a small, simple and affordable system."
Nominations for the Best in Test competition were submitted by manufacturers and users of products introduced between 1 November 2005 and 31 October 2006. The magazine publishes its list of Best in Test finalists in December and asks readers to vote for the Test Product of the Year. Representatives from Test & Measurement World will announce the results at the APEX/IPC trade show that takes place from 20-22 February 2007 in Los Angeles, USA.
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