National Instruments is announcing its plans for NIWeek, the event covering virtual instrumentation and graphical system design. NIWeek 2007, the company's 13th annual customer and technology conference, opens on 7 August 2007 at the Austin Convention Center in Austin, Texas, for three days of interactive technical sessions, targeted forums, exhibitions and hands-on workshops on the latest developments for design, automation, manufacturing and test.
Dr James Truchard, NI CEO, President and Cofounder, comments: "Each year, thousands of engineers and scientists have made NIWeek a success by sharing their ideas and experiences with colleagues while learning about the most recent technologies and solutions for design, control and test. At NIWeek 2007, we will explore how flexible graphical programming software, combined with increasingly powerful technologies such as multicore processors and reconfigurable FPGAs, along with higher-performance, easier-to-use bus architectures such as PCI Express and USB, can lead to dramatic improvements for rapid design, prototyping and deployment of design, control and test systems."
NIWeek 2007 will feature world-renowned presenters including Truchard, who will explain the latest trends and design approaches to address the growing needs of engineering around the world in his opening keynote address. Truchard will show attendees how to apply the graphical system design approach to exciting application areas, including algorithm engineering, mechatronics, communications design and high-performance digital test.
In addition to Truchard, Tim Dehne, NI Senior Vice President of R&D, will present a variety of technology demonstrations to illustrate how innovative thinkers are shaping the future, and Jeff Kodosky, NI Cofounder and Business and Technology Fellow, will discuss the new technologies that are driving the future of the NI LabVIEW graphical development environment.
Over 180 technical sessions
The conference features more than 180 technical sessions, including hands-on workshops, case studies, user applications and panel discussions from companies and universities such as Analog Devices, Drexel University, Endevo, Intel, Texas Instruments and the University of Illinois at Urbana-Champaign. The sessions will highlight innovative approaches to solving design, test and measurement challenges and showcase the latest products and solutions from customers, partners and NI. The conference programme provides attendees with training opportunities and the chance to discover advanced measurement and analysis techniques while networking with industry peers. The conference also features four summits on graphical system design, vision, RF and wireless communications and sound and vibration.
The NIWeek 2007 exhibition includes more than 200 exhibits of innovative virtual instrumentation and graphical system design products and solutions. On the expo floor, attendees can meet engineers from a wide range of industries, try out the latest products and see next-generation innovations in action. Attendees can also see the technical content discussed in the sessions come to life in applications highlighted in the five pavilions featured on the exhibition floor – graphical system design, RF and communications, vision, sound and vibration and LabVIEW.
Find out more about NIWeek 2007, register for the event or sign up to exhibit at www.ni.com/niweek.
