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Condition monitoring and alignment tools to be shown

14 January 2008

SKF (UK) Ltdvisit website

 

Condition monitoring and alignment tools to be shownSKF will launch its latest generation of Asset Efficiency Optimisation (AEO) technology at Maintec 2008. On display will be a wide range of products designed to enable companies to cut maintenance costs and optimise production levels, while SKF's technical specialists will be on hand to discuss recent developments in condition monitoring and machine alignment practices.

Among the products being exhibited will be the new MARLIN-Pro IS handheld ATEX Zone 1 data collection and analysis tool, which is an exceptionally reliable, rugged mobile computer designed to capture inspection and process data relating to mission-critical machinery. The instrument's ATEX Zone 1 certification ensures the product meets the stringent safety requirements for use around flammable gasses, vapours, liquids, dusts or fibres.

Also at Maintec will be the Wireless Machine Condition Detector (WMCD), which can be used with the MARLIN handheld data manager for carrying out operator inspections quickly and safely. The system uses smart studs and temperature magnets to measure and record vibration, enveloped acceleration and temperature, enabling operating costs to be reduced considerably as part of a condition-based maintenance programme.

The SKF Wireless Machine Condition Detector uses Bluetooth technology to collect and communicate data quickly and accurately, which can then be uploaded to the SKF @ptitude Monitoring Suite, also being shown at Maintec. SKF @ptitude is a comprehensive software suite providing a common platform on which to view and analyse data from all SKF portable and on-line technologies. Consolidating data in this way makes analysis and reporting simple and fast, and enables interfacing with other plant-wide systems, such as SKF @ptitude Decision Support, CMSS and DCS.

SKF's engineers will be available to discuss these latest technologies and more at stand G34 at Maintec, which is being held at the NEC, Birmingham, from 11-13 March 2008.

 
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