National Instruments UK & Ireland has opened registration for a free one-day conference to address current trends in test. The NI Automated Test Summit 2010 is described as an essential conference for engineers wanting to learn about the latest advances in automated and software-defined test.
Held at The Royal Berkshire Conference Centre, Madejski Stadium, Reading, on Thursday 10 June 2010, the Summit will feature technical training, product and application demonstrations, industry case studies from end-users, and hands-on sessions about the latest technologies for virtual and synthetic instrumentation.
Topics will include real-time and hardware-in-the-loop test, RF and wireless test, and the role of FPGAs in test, together with a focus on software-defined systems using PXI and modular instrumentation. Attendees will gain valuable hands-on experience and hear from industry experts about how to reduce development time and ensure longevity.
Donald Blyth, Chief Engineer (Test) at Selex Galileo UK will present the Keynote address, giving his own industry perspective, with experience gained from a 25-year career in test and instrumentation within the military and aerospace industry, while Eric Starkloff, NI Vice President of Product Marketing for Test, will speak about the Top Trends Changing The Face of Automated Test.
For more than 30 years, National Instruments has helped companies worldwide build more cost-effective automated test systems. While continuing to serve as one of today's leading authorities in instrument control, NI is now driving innovation in test system design with virtual instrumentation. Attend the Automated Test Summit to see how companies are reducing costs by investing in a platform that combines open PC technologies and modular instrumentation with industry-leading test system software.
For the full agenda and to register, go to www.ni.com/uk/testsummit.