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NI Automated Test Outlook reinforces need for smart test systems

28 January 2016

National Instruments Corporation (UK) Ltdvisit website

 

NI Automated Test Outlook reinforces need for smart test systemsNI is releasing its Automated Test Outlook 2016. The annual test and measurement report delivers a comprehensive view of the key trends expected to impact automated test environments with the proliferation of connected devices, from preparing to test mmWave communication to effectively using manufacturing test data to propel business results.

Luke Schreier, Director of Automated Test Marketing at NI, says: “As strong advocates for excellence in automated test, we work closely with customers and suppliers to understand the top issues facing manufacturing and test departments. Whether your challenge is testing millions of Internet of Things devices or managing a 20-year-old test system, our goal is to spark dialogue within your organisation to help you lower the cost of test and stay ahead of your competition.”

Automated Test Outlook 2016 explores the following topics:

COMPUTING: Harvesting Production Test Data

Semiconductor organisations pioneer real-time data analytics to reduce manufacturing test cost.

SOFTWARE: Life-Cycle Management Is All About Software

Obsolescence, OS churn, and compatibility challenge long life cycle projects—an age-old problem warrants revisiting.

ARCHITECTURE: The Rise of Test Management Software

Off-the-shelf test executives are effective options for the influx of new programming languages.

I/O: Standardising Platforms from Characterisation to Production RFIC companies employ IP reuse and hardware standardisation across the product design cycle to reduce cost and shorten time to market.

BUSINESS STRATEGY: Making (mm)Waves in Test Strategy

Test managers are adopting modular products to economically validate high-frequency components.

Download the complete Automated Test Outlook report at www.ni.com/ato.

National Instruments Corporation (UK) Ltdvisit website
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