National Instruments is introducing test systems for 802.11ac WLAN and Bluetooth low-energy technology that combine NI graphical system design software and modular, FPGA-based PXI instrumentation to provide user-programmable, high-performance test capabilities. These test systems, along with other cellular, navigation and wireless connectivity products from NI, help engineers thoroughly test their devices on a single high-performance platform.
The new NI bundle for 802.11ac WLAN and Bluetooth low-energy technology test combines the NI WLAN Measurement Suite with the FPGA-based NI PXIe-5644R vector signal transceiver (VST) and NI LabVIEW for a high-performance, software-designed test system. The NI test systems for 802.11ac WLAN and Bluetooth provide error vector magnitude (EVM) performance and up to 5x gains in production test throughput compared with traditional box instrumentation.
Doug Johnson, Director of Engineering at Qualcomm Atheros, says: "Using the software-designed vector signal transceiver and the WLAN measurement suite, we improved our test speeds by more than 200 times compared to traditional rack-and-stack instruments while also significantly improving test coverage."
- Suitable for characterisation and production test with best-in-class RMS EVM of -46dB for 256 QAM
- Ability to perform measurements and custom algorithms in the onboard FPGA of the NI PXIe-5644R VST for faster measurements and real-time test
Find out more with these resources:
NI PXI Express Product Page: www.ni.com/80211ac.
White Paper 'Merging High-Performance Instruments and FPGAs for Best-in-Class WLAN Measurements': www.ni.com/white-paper/14058/en.