2012 Automated Test Summit highlights trends in testing

30 April 2012

National Instruments Corporation (UK) Ltdvisit website


The biennial Automated Test Summit, hosted by National Instruments UK & Ireland, is returning to the Royal Berkshire Conference Centre at the Madejski Stadium in Reading on Thursday 21 June 2012. Featuring technical training, demonstrations, industry experts, product developers and system integrators, this free, full-day conference and exhibition gives attendees the opportunity to learn more about the top trends currently influencing the automated test industry.

Through technical presentations, attendees will explore the latest technologies for virtual and synthetic instrumentation, including new hardware technologies for RF and wireless; real-time and hardware-in-the-loop test; and the benefits of a flexible, software-defined approach to automated test.

Presentations from industry experts include Fernando Solorzano, Automation Hardware Test Engineer from BSkyB, who will talk about the system he has implemented to test BSkyB's set-top boxes. Using National Instruments PXI-based modular instruments and open software such as NI LabVIEW, NI TestStand, NI Audio Master and the NI Video Measurements Suite, he has reduced the test time by a factor of three, from man-days to only a few hours. This also provides the flexibility to concurrently test multiple set-top boxes.

In his Keynote presentation, Luke Schreier, National Instruments Senior Group Manager for Automated Test, will highlight each of the five trends in the 2012 Automated Test Outlook, a comprehensive view of key technologies and methodologies that are impacting the test and measurement industry.

The Summit offers a choice of 10 hours of hands-on sessions, giving attendees the chance to experience RF systems on PXI and build an automated test system with PXI and NI TestStand. The accompanying exhibition showcases 11 systems integrators and sensors manufacturers, providing an excellent networking opportunity.

Additionally, attendees who are proficient in LabVIEW are invited to take the Certified LabVIEW Associate Developer exam free of charge at the Automated Test Summit, a saving of £99 or €109. For the first time, NI is also inviting TestStand users to complete the Certified TestStand Developer exam during the event, providing a saving of £149 or EUR169.

How to register

Registration for the Automated Test Summit is free, through the website at, or call +44 (0)1635 572498 or email .

National Instruments Corporation (UK) Ltdvisit website
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