National Instruments is expanding of its line of PXI SMUs for automated semiconductor test. Suitable for parallel testing of multipin semiconductor DUTs, the new NI PXIe-4143 SMU offers 600,000 samples per second and four channels - claimed to be the highest channel density of any SMU - and expands NI's multichannel SMU output range to 24V at 150mA. Such features help reduce the cost of capital equipment, decrease test times and increase mixed-signal flexibility for a variety of DUTs.
Ron Wolfe, Vice President of Semiconductor Test at National Instruments, says: "With the new NI PXIe-4143, our SMU family now gives test engineers DC measurement options for almost any device. Our industry-leading channel counts, superior sample rates and SourceAdapt technology for custom tuning, provide one of the most flexible selections of semiconductor measurement instruments available."
Readers can learn more about the NI PXIe-4143 and other SMUs with the following additional resources:
NI PXIe-4143 technical details
NI PXIe-4142 technical details
SourceAdapt technology demonstration
How NI PXI technology addresses semiconductor test
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