NI at New Electronics Test and Measurement Design Day

21 April 2008

National Instruments Corporation (UK) Ltdvisit website


National Instruments is joining Agilent, Anritsu, Tektronix, QualiSystems and Yokogawa at the New Electronics Test and Measurement Design Day. Taking place at Reading's Madejski Stadium on 15 May 2008, the one-day conference and exhibition will focus on next-generation test products, covering three technology-based streams: wireless test, embedded test and software-related issues.

Through hands-on sessions and technical presentations, National Instruments UK and Ireland Technical Marketing Director Ian Bell will introduce three key technologies for test and measurement and outline a software-defined test system architecture that promotes performance, flexibility and re-use.

Bell says: "Just as software drives new capabilities in electronic products, it is also impacting the systems used to test these devices both at the design stage and through into manufacturing. The pace of change in technologies and communications protocols demands that modern test systems be software-defined, whether they are single instruments or complete automated test architectures. The right software architecture is an essential technology for modern test systems. For example, it provides the infrastructure to accommodate any test device on any bus at the same time as delivering the flexibility to address rapidly changing communications standards.

"Software is also the key to addressing the challenge that new processors present to test engineers. To continue realising performance gains without increased clock rates, processor manufacturers have developed processors with multiple cores on a single chip. With multicore processors, test engineers can develop automated test applications capable of achieving high throughput through concurrent processing. The inherent parallelism of graphical dataflow software, like National Instruments LabVIEW, helps engineers immediately benefit from multicore processors and overcome the complexity associated with traditional text-based languages.

"Finally, more manufacturers are including FPGAs on modular instruments and giving engineers the access in software to reprogram them according to their requirements. For example, test engineers can embed a custom algorithm into the device to perform in-line processing inside the FPGA or emulate part of the system that requires a real-time response. New system-level software tools are emerging so engineers can rapidly configure FPGAs without writing low-level VHDL code."

To register for the Test & Measurement Design Day, visit or use the form on this page.

National Instruments Corporation (UK) Ltdvisit website
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