National Instruments is introducing the NI PXIe-1066DC 18-slot chassis, which adds high-availability features to the PXI Express platform to maximise system uptime. These features improve the system-level mean time before failure (MTBF) and mean time to repair (MTTR) of PXI systems in many demanding, mission-critical test, measurement and control applications. The chassis adds critical component redundancy and remote monitoring to the uptime-focused capabilities of existing NI PXI instrumentation.
Dr Tom Bradicich, R&D Fellow at National Instruments and former Vice President of Systems technology at IBM, says: "The NI PXIe-1066DC chassis builds on the long-standing leadership of the PXI standard for mission-critical projects. This new chassis illustrates NI's continued commitment to superior reliability, availability, serviceability and manageability when system uptime is paramount."
Learn more about the NI PXIe-1066DC by visiting www.ni.com/1066dc.
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